The Use of X-Ray Diffraction Peaks Profile Analysis to Define the Structural Condition of Elastically Stressed 09G2S Steel-Reference-Cited by-同舟云学术

The Use of X-Ray Diffraction Peaks Profile Analysis to Define the Structural Condition of Elastically Stressed 09G2S Steel

Published:2020-05 Issue: Volume:992 Page:981-986
ISSN:1662-9752
Container-title:Materials Science Forum
language:
Short-container-title:MSF

Author:

Gulyaev V.P.¹,Petrov P.P.²,Stepanova Ksenia V.²

Affiliation:

1. Ammosov North-Eastern Federal University

2. North of the Siberian Branch of the RAS

Abstract

By using X-ray diffractometry, it was determined how short-term stresses, being within the limits of the offset yield strength σs, influence changes in the diffraction line profile characteristics resulting from static tension in plate specimens of 09G2S (09Г2С) structural steel. Microstructural changes in the surface of 09G2S steel specimens considered in this work were studied at different levels of elastic stress. The special aspects of changes in the diffraction line profile characteristics are presented and discussed, specifically, a broadening of the profile maximum half-width (B), as a response to the external mechanical impact on the surface layers.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.scientific.net/MSF.992.981.pdf

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