High Temperature High Current Gain IC Compatible 4H-SiC Phototransistor
Author:
Affiliation:
1. KTH Royal Institute of Technology
2. Royal Institute of Technology (KTH)
3. KTH, Royal Institute of Technology
Abstract
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
https://www.scientific.net/MSF.963.832.pdf
Reference6 articles.
1. S. Hou, P.-E. Hellström, C.-M. Zetterling and M. Östling, Scaling and modeling of high temperature 4H-SiC pin photodiodes, IEEE Journal of the Electron Devices Society 6 (1), 139- 145 (2018).
2. M. Razeghi and A. Rogalski, Semiconductor ultraviolet detectors, Journal of Applied Physics 79, 7433-7573 (1996).
3. S. Hou, P.-E. Hellström, C.-M. Zetterling and M. Östling, 550° C 4H-SiC pin photodiode array with two-layer metallization, IEEE Electron Device Letters 37 (12), 1594-1596 (2016).
4. M. Shakir, S. Hou, B. G. Malm, M. Östling and C. Zetterling, A 600 °C TTL-based 11-stage ring oscillator in bipolar silicon carbide technology, IEEE Electron Device Letters 39 (10), 1540-1543 (2018).
5. L. Lanni, B. G. Malm, M. Östling and C.-M. Zetterling, Influence of passivation oxide thickness and device layout on the current gain of SiC BJTs, IEEE Electron Device Letters 36 (1), 11-13 (2015).
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