Vertical Channel Silicon Carbide JFETs Based Operational Amplifiers

Author:

Maralani Ayden1,Mazzola M.S.1,Pisano A.P.1

Affiliation:

1. University of California

Abstract

Superior performance of the Silicon Carbide (SiC) semiconductor in high temperature and harsh environment is widely known. However, utilizing the Vertical Channel 4H–SiC JFET (SiC VJFET) for analog circuit design exhibits significant design challenges, even at room temperature. The fundamental challenges are low intrinsic gain, the limitation of the Gate to Source Voltage Range (GSVR), and restrictions on utilizing Channel Length (CL) as a design parameter due to fabrication complexity. These challenges must be successfully overcome at room temperature, before moving forward with high temperature design. After addressing these issues, two operational amplifiers (opamps) with two distinct design topologies are designed and fabricated. The first design (opamp-1) emphasizes on the gain and Common Mode Rejection Ratio (CMRR) performances [1]. The second design (opamp-2) presents a novel opamp [2] with universal applications where the reliability and unity gain frequency performances are also improved. In this paper, the performance parameters of these two opamps along with their design topologies are reported and compared.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference5 articles.

1. A. Maralani, et al., IEEE Int. Symp. on Circuits and Systems, May 2009. p.1953–(1956).

2. A. Maralani, et al., IEEE Trans. Circuits and Systems, Feb. 2012 p.255–265.

3. I. Sankin, et al., SiC Lateral Trench JFET for Harsh-Environment Wireless Systems, in Material Science Forum, (2008).

4. A. Maralani, et al., Material Science Forum, 2009, vols. 615–617, p.915–918.

5. D. H. Smith, An Improved Model for GaAs MESFETs, TriQuint Semiconductor, Inc., Beaverton, OR, Tech. Rep., Feb. (1995).

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