Development of 15 kV 4H-SiC IGBTs

Author:

Ryu Sei Hyung1,Cheng Lin2,Dhar Sarit2,Capell Craig1,Jonas Charlotte1,Clayton Jack2,Donofrio Matt2,O'Loughlin Michael J.2,Burk Albert A.2,Agarwal Anant K.3,Palmour John W.2

Affiliation:

1. Cree Incorporation

2. Cree, Incorporation

3. Cree, Inc.

Abstract

We present our latest developments in ultra high voltage 4H-SiC IGBTs. A 6.7 mm x 6.7 mm 4H-SiC N-IGBT with an active area of 0.16 cm2 showed a blocking voltage of 12.5 kV, and demonstrated a room temperature differential specific on-resistance of 5.3 mΩ-cm2 with a gate bias of 20 V. A 4H-SiC P-IGBT exhibited a record high blocking voltage of 15 kV, while showing a differential specific on-resistance of 24 mΩ-cm2. A comparison between P- and N- IGBTs in 4H-SiC is provided in this paper.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference4 articles.

1. A. Agarwal et al., Mat. Sci. forum Vol. 645-648 (2010), pp.1017-1020.

2. Q. Zhang et al., IEEE EDL, V. 29, Is. 9, Sep. 2008, p.1027.

3. M. Das et al., Proceedings of ISPSD 2008, Orlando, FL, May 18-22, pp.253-255.

4. A. Hefner and D. Blackburn, IEEE Trans. PE, vol. PE-2, Is. 3, Jul 1987, p.194.

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