Origin of hole mobility anisotropy in 4H-SiC

Abstract

Hole mobility anisotropy in 4H-SiC was investigated based on both experimental and theoretical approaches. First, the authors established a complete database of the anisotropic hole mobility along both directions parallel and perpendicular to the c-axis in 4H-SiC over the wide acceptor density and temperature ranges by preparing Hall bar structures on p-type SiC(112¯0) epitaxial layers. Empirical equations for the mobility along each direction vs the acceptor density and temperature were determined, which should be useful for the simulation and designing of any SiC devices. In addition to that, the anisotropy in the hole mobility was extracted from the experimental results, and its origin was discussed focusing on that in the effective mass (m∗) of holes. The obtained mobility ratio was far from the m∗ ratio at the valence band maximum, and an averaged m∗ along each direction was determined by theoretical calculation taking into account the energy distribution of holes. Consequently, the authors revealed that the anisotropic hole mobility is explained quantitatively by the anisotropic m∗ considering the E–k dispersion over the entire first Brillouin zone.