Post CMP Wet Cleaning Influence on Cu Hillocks
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Published:2016-09
Issue:
Volume:255
Page:270-276
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ISSN:1662-9779
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Container-title:Solid State Phenomena
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language:
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Short-container-title:SSP
Author:
Votta Annamaria1,
Pipia Francesco1,
Livellara Luisito1,
Caminati Manuela1,
Spadoni Simona1,
Ravizza Enrica1,
Grasso Salvatore1,
Bollin Maddalena1,
Moroni Maurizio1,
Alessandri Mauro1,
Colpani Paolo1
Abstract
Up to date, it is commonly reported in literature that the amount of copper hillocks is dependent on a) the total amount of residual Cu oxide after Cu CMP, and b) the Cu nitridation. The present work describes how that is only partially true: hillocks depend also on the kind of oxide and on the roughness of the surface after wet treatment. This contribution is even more important than what reported in literature. A tentative model for this behavior is proposed.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics
Cited by
1 articles.
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