High-Temperature Operating Characteristics of Inverter Using SBD-Integrated MOSFET
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Published:2020-07
Issue:
Volume:1004
Page:1115-1122
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ISSN:1662-9752
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Container-title:Materials Science Forum
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language:
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Short-container-title:MSF
Author:
Sato Shinji1, Kato Fumiki1, Hozoji Hiroshi2, Sato Hiroshi1, Yamaguchi Hiroshi1, Harada Shinsuke1
Affiliation:
1. National Institute of Advanced Industrial Science and Technology 2. National Institute of Advanced Industrial Science and Technology (AIST)
Abstract
In the conventional SiC-MOSFET, a PN junction diode is included between the source and drain. This P-N junction diode not only causes device degradation, but also generates a large reverse recovery surge voltage during high temperature operation. This surge voltage increases the electrical stress of the power converter, causing dielectric breakdown and control malfunction. We have developed a SBD integrated SiC-MOSFET. This MOSFET reduces the occurrence of reverse recovery surge voltage during high-temperature operation caused by inactivating the included PN junction diode. In this paper, we discuss the characteristics of the inverter composed of the developed SiC-MOSFET in high-temperature operation. As a result, the inverter using a SBD integrated SiC-MOSFET with the PN junction diode deactivated was able to reduce surge voltage at high temperature operation.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference6 articles.
1. S. Sato, H. Tanisawa, T. Anzai, H. Takahashi, Y. Murakami, F. Kato, K. Watanabe, H. Sato, Development of wire-bonding-less SiC power module operating in a wide temperature range,, Materials Science Forum, Vol. 858, pp.1066-1069, 2016.04. 2. S. Sato, F. Kato, H. Tanisawa, K. Koui, K. Watanabe, Y. Murakami, H. Sato, H. Yamaguchi, Development of High Temperature Operation SiC Power Module,, ECS Transactions, vol.86, no.12, pp.83-90, 2018.08. 3. S. Harada et al., 1200 V SiC IE-UMOSFET with Low On-Resistance and High Threshold Voltage,, Materials Science Forum, Vol. 897, pp.497-500 (2017). 4. Y. Kobayashi, N. Ohse, T. Morimoto, M. Kato, T. Kojima, M. Miyazato, M. Takei, H. Kimura, S. Harada, Body PiN diode inactivation with low on-resistance achieved by a 1.2 kV-class 4H-SiC SWITCH-MOS,, IEEE International Electron Devices Meeting (IEDM), 9.1, pp.217-214, 2017.12. 5. R. Aiba, M. Okawa, T. Kanamori, H. Yano, N. Iwamuro, Y. Kobayashi, S. Harada, Experimental Demonstration on Superior Switching Characteristics of 1.2 kV SiC SWITCH-MOS,, ISPSD 2019, pp.23-26, 2019.05.
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