Properties of Hydrogen, Oxygen and Carbon in Si
Author:
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics
Link
https://www.scientific.net/SSP.32-33.143.pdf
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The mechanism of the irradiation synergistic effect of silicon bipolar junction transistors explained by multiscale simulations of Monte Carlo and excited-state first-principle calculations;The Journal of Chemical Physics;2023-07-21
2. Influence of Point Defects on the Equilibrium Concentration of Interstitial Oxygen in Crystalline Silicon;Ukrainian Journal of Physics;2022-02-10
3. Вплив легування атомами B, Si та P на електронні властивості кристала AlN з домішкою Mn;Ukrainian Journal of Physics;2022-02-10
4. Positron annihilation on defects in silicon irradiated with 15 MeV protons;Journal of Physics: Condensed Matter;2012-12-10
5. Atomic Environment of Positrons Annihilating in Different Parts of Cz-Si Single Crystal;Solid State Phenomena;2003-09
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