High Sensitive Active MOS Photo Detector on the Local 3D SOI-Structure
Author:
Affiliation:
1. Precarpathian University Named after V.Stephanyk
2. Lviv Polytechniс National University
Abstract
Publisher
Trans Tech Publications, Ltd.
Subject
General Engineering
Link
https://www.scientific.net/AMR.854.45.pdf
Reference5 articles.
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2. G. Yamahata, K. Nishiguchi, and A. Fujiwara, Accuracy evaluation of single-electron shuttle transfer in Si nanowire metal-oxide-semiconductor field-effect transistors, Appl. Phys. Lett. 98 (2011) 222104.
3. W. Du, H. Inokawa, H. Satoh, and A. Ono, Single-photon detection by a simple Silicon-on-Insulator Metal–Oxide–Semiconductor field-effect transistor, Jap. Journ. of Appl. Phys. 2012. – Vol. 51. – P. 06FE01-4.
4. Patent № 34277 UA, MKI 41/00, Kogut I.T., Holota V.I., Druzhinin A.O., Sapon S.V., Publ. 11. 08. 2008; Bull. № 15. 10 p.
5. Patent № 62085, МPК (2011. 01) B81C 1/00, B82B 3/00, Kogut I.T., Holota V.I., Publ. 10. 08. 2011. Bull. № 15. 14 p.
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