A Surge Current Stable and Avalanche Rugged SiC Merged pn Schottky Diode Blocking 600V Especially Suited for PFC Applications

Author:

Treu Michael1,Rupp Roland2,Tai Chee Siew3,Blaschitz Peter1,Hilsenbeck Jochen1,Brunner Helmut1,Peters Dethard4,Elpelt Rudolf2,Reimann T.5

Affiliation:

1. Infineon Technologies Austria AG

2. Infineon Technologies AG

3. Infineon Technologies AG, Free Trade Zone

4. SiCED Electronics Development

5. ISLE GmbH

Abstract

Today silicon carbide (SiC) Schottky diodes are mainly used in the power factor control (PFC) unit of high end switched mode power supplies, due to their outstanding switching performance compared to Si pn diodes. In the case of the PFC it is required that the diodes are capable of handling surge currents up to several times the current of normal operation. The paper shows the surge current capability of a merged pn Schottky diode where the p-areas are optimized as efficient emitters. During normal operation the diode is behaving like a normal Schottky diode whereas during surge current condition the diode is behaving like a pn diode. For a sine half wave of 10 ms we achieved a non repetitive peak forward current capability of about 3700 A/cm2 which is about ten times rated current (for comparison: destructive current density of a standard Schottky diode ~ 1650 A/cm²). Additionally the device shows a stable avalanche and is able to withstand a single shot avalanche of 9.5 3s and 12.5 mJ.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Impact of Layout Arrangement on Surge Current and Avalanche Robustness of Silicon Carbide JBS Diodes;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

2. Plasma Spreading Layers: An Effective Method for Improving Surge and Avalanche Robustness of SiC Devices;IEEE Transactions on Electron Devices;2021-11

3. Comparing Hexagonal and Circular Cell designs for SiC MPS Diode: The Curvature Effect on Avalanche Capability;2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia);2021-08-25

4. 1200-V 4H-SiC Merged p-i-n Schottky Diodes With High Avalanche Capability;IEEE Transactions on Electron Devices;2020-09

5. Ruggedness of SiC devices under extreme conditions;2020 IEEE International Reliability Physics Symposium (IRPS);2020-04

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