Affiliation:
1. Universiti Pertahanan Nasional Malaysia
2. Universiti Kebangsaan Malaysia (UKM)
3. Universiti Kebangsaan Malaysia
Abstract
Tin-Silver-Copper (SnAgCu) lead-free solder on Electroless Nickel Immersion Gold (ENiG) and Immersion Tin (ImSn) surface finish printed circuit board was subjected to blast test. A variation of intermetallic compounds (IMC) layer, hardness and reduced modulus of soldered sample exposed to blast test were intensively investigated using optical microscope and nanoindentation machine. Formation of IMCs due to reaction between solder and substrate during blast test provided deleterious effect of metallurgical bond strength and reliability on the solder joint. Microstructural analysis was evaluated via Infinite Focused Microscope (IFM). The findings of these studies indicate that best surface finished for blast test performance was not necessarily the best surface finish for optimum reliability. ENiG and ImSn surface finish can be advantage or a disadvantage depending on the application, package and reliability requirements. As a result, most component assemblers are using ENiG and ImSn in order to improve solderability as well as the wettability between solder and the substrate and to meet various package requirements.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics
Cited by
1 articles.
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