Abstract
We report on a simple method for the fabrication of metalized tips by depositing gas-phase synthesized silver nanoparticles onto atomic force microscope (AFM) tips. The method enables fabricating tips suitable for AFM based tip-enhanced Raman spectroscopy (TERS) with high yield. The performance of the fabricated silver nanoparticle decorated tips is examined by detecting low concentration BPE molecules using a transmission mode TERS setup. An 30-fold enhancement of the Raman signal is shown. The net TERS enhancement factor is calculated to be about 1000.
Publisher
Trans Tech Publications, Ltd.
Cited by
1 articles.
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