Effect of Properties of Underfill Materials on Thermal Stress Relief in Lead-Free Solder Joint of Chip Size Package

Author:

Shohji Ikuo1,Yoshizawa Keisuke1,Nishimoto Masaharu2,Kawano Takayuki2

Affiliation:

1. Gunma University

2. SOMAR Corporation

Abstract

The effect of the mechanical and physical properties of an underfill material on thermal stress relief in a lead-free chip size package (CSP) solder joint has been investigated. Thin sheets of underfill materials for the CSP solder joint were prepared and the mechanical and physical properties of the sheets were investigated. Using these properties, thermal stress relief in an encapsulated CSP lead-free solder joint with the underfill material was examined by a finite element analysis method under thermal cycle conditions in the temperature range from 293K to 398K and 233K.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference10 articles.

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2. M. Ogawa, R. Murakami, M. Sumikawa and H. Matsubara: Proc. of MES2002 (2002), p.155.

3. H. Schaefer, U. Maurieschat, H. Schimanski, M. H. Poech, E. Hoefer and T. Harder: Proc. of 4th IEEE International Conference on Polymers and Adhesives in Microelectronics and Photonics (2004), p.153.

4. A. Yaguchi, M. Nakamura, T. Ishikawa, K. Kurosawa and R. Kimoto: Journal of Japan Institute of Electronics Packaging Vol. 7 (2004), p.613.

5. Y. Kariya, T. Asai, T. Suga and M. Otsuka: TMS Letters Vol. 1 (2004), p.169.

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