Affiliation:
1. Dong-Eui University
2. DGIST
3. Kyoto Institute of Technology
Abstract
The 3C-SiC (111) layer has been grown on Si (110) substrate by using hexachloro-disilane (HCDS) and propane. The propane flow rate was controlled in the carbonization step and the growth step for obtaining SiC layer with high crystal quality. The high quality epitaxial 3C-SiC (111) layer was successfully grown at growth temperature of 1280°C and lower propane flow rate condition. Grown 3C-SiC epitaxial layers were systematically analyzed by an optical microscope, Raman spectroscopy, FE-SEM and XRD
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science