Particle Measurement with a Liquid-Borne Particle Counter: Analytical Figures of Merit

Author:

Liu Shi1ORCID,Liu Bin1

Affiliation:

1. ChemTrace Analytical Services

Abstract

Particle contamination is one of the major concerns in semiconductor industry as it can reduce device yield, device quality and device reliability [1]. Liquid-borne particle counters (particle counters) are widely used to measure particle levels in water, chemicals, and other process liquids. In conjunction with sonication in ultrapure water and/or other liquids, these counters are also used to measure particle levels on surfaces of wafers and/or chamber parts to determine the cleanliness of wafer/part surface and to evaluate and improve surface cleaning processes. They have become indispensable tools in semiconductor surface cleaning processes [2].

Publisher

Trans Tech Publications, Ltd.

Subject

Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics

Reference6 articles.

1. T. Hattori (Ed. ), Ultraclean Surface Processing of Silicon Wafers (Springer-Verlag, Berlin Heidelberg. 1998).

2. R. P. Donovan (Ed. ), Particle Control for Semiconductor Manufacturing (Marcel Dekker, Inc., New York, 1990).

3. ISO 21501-2: 2007(E). Determination of particle size distribution – Single particle light interaction methods – Part 2: Light scattering liquid-borne particle counter (2007).

4. M. E. Swartz, I. S. Krull, Handbook of Analytical Validation (CRC Press, New York, 2012).

5. Automotive Industry Action Group, Measurement Systems Analysis; Reference Manual (4th ed. ). (Automotive Industry Action Group, Detroit, 2010).

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