Optimization of SiC MESFET for High Power and High Frequency Applications

Author:

Ejebjörk Niclas1,Zirath Herbert1,Bergman Peder2,Magnusson Björn3,Rorsman Niklas1

Affiliation:

1. Chalmers University of Technology

2. Linköping University

3. Norstel AB

Abstract

SiC MESFETs were scaled both laterally and vertically to optimize high frequency and high power performance. Two types of epi-stacks of SiC MESFETs were fabricated and measured. The first type has a doping of 3×1017 cm-3 in the channel and the second type has higher doping (5×1017 cm-3) in the channel. The higher doping allows the channel to be thinner for the same current density and therefore a reduction of the aspect ratio is possible. This could impede short channel effects. For the material with higher channel doping the maximum transconductance is 58 mS/mm. The maximum current gain frequency, fT, and maximum frequency of oscillation, fmax, is 9.8 GHz and 23.9 GHz, and 12.4 GHz and 28.2 GHz for the MESFET with lower doped channel and higher doping, respectively.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A novel 4H–SiC MESFET with P-type doping zone and recessed buffer layer;Materials Science in Semiconductor Processing;2022-06

2. OBIC technique applied to wide bandgap semiconductors from 100 K up to 450 K;Semiconductor Science and Technology;2017-04-05

3. A novel 4H-SiC MESFET with serpentine channel for high power and high frequency applications;Superlattices and Microstructures;2017-01

4. Improved double-recessed P-buffer 4H-SiC MESFETs with partial heavy doped channel;Materials Science in Semiconductor Processing;2016-12

5. Improved multi-recessed 4H–SiC MESFETs with double-recessed p-buffer layer;Materials Science in Semiconductor Processing;2015-12

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