Investigation of TiO2 Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy

Author:

Rubenis Kristaps1,Kundzins Karlis2,Locs Janis1,Ozolins Jurijs1

Affiliation:

1. Riga Technical University

2. University of Latvia

Abstract

Dense TiO2 (rutile) ceramic samples were prepared by sintering compacts of titanium dioxide anatase powder at 1500 °C for 5h. Sintered samples were polished and annealed in vacuum at 1000 °C for 1h. Structural properties of the samples were studied by X-ray diffraction, polarized light and scanning electron microscopy. The surface topography and local electrical conductivity of the samples were investigated by atomic force microscopy technique under atmospheric conditions. Enhanced electrical conductivity was observed at grain boundaries while the polished, vacuum annealed grains surface showed non-homogeneous conductivity.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

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