Computed Tomography for Application in Manufacturing Metrology-Reference-Cited by-同舟云学术

Computed Tomography for Application in Manufacturing Metrology

Published:2010-05 Issue: Volume:437 Page:73-78
ISSN:1662-9795
Container-title:Key Engineering Materials
language:
Short-container-title:KEM

Author:

Weckenmann Albert¹,Krämer Philipp¹

Affiliation:

1. Friedrich-Alexander-University Erlangen-Nuremberg

Abstract

As a rather new technology, X-Ray Computed Tomography offers new and promising possibilities in manufacturing metrology in comparison to well-established tactile or optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://www.scientific.net/KEM.437.73.pdf

Reference4 articles.

1. A. Weckenmann, P. Krämer and J. Hoffmann: Manufacturing Metrology - State of the Art and Prospects, in: Proceedings of the 9 th International Symposium on Measurement and Quality Control (ISMQC), Chennai, India (2007), pp.1-8.

2. J. Ambrose and G. Hounsfield: Computerized transverse axial tomography, in: British Journal of Radiolog., 46 (542) (1973), pp.148-149.

3. L.A. Feldkamp, L.C. Davis and J.W. Kress: Practical cone-beam algorithm, in: Journal of the Optical Society of America A, 1 (6) (1984), pp.612-619.

4. R. Christoph and W. Rauh: Measuring Precisely and Traceably Using X-Ray Computed Tomography, in: Proceedings of the XII. International Colloquium on Surfaces, Chemnitz, Germany (2008), pp.346-354.

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