Routine Use of the Crystal Device Integrity Testing System in Pediatric Patients

Abstract

Crystal Device Integrity Testing System (CITS), the first commercially available testing system of its type, allows rapid assessment of cochlear implant function by measuring averaged electrode voltages—the scalp-recorded fields generated by electrode currents. We describe our experience performing routine integrity tests on 44 pediatric cochlear implant patients using the CITS. We present our findings focusing on the monopolar and common ground scans to provide a framework from which CITS scans can be evaluated in the future. We also describe selected cases in which abnormal results using the CITS influenced clinical treatment, demonstrating the utility of performing routine integrity tests.