CRAST: Crash-resilient data management for a key-value store in persistent memory-Reference-Cited by-同舟云学术

CRAST: Crash-resilient data management for a key-value store in persistent memory

Published:2018 Issue:23 Volume:15 Page:20180919-20180919
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Han Youil¹,Lee Eunji¹

Affiliation:

1. Department of Computer Science, Chungbuk National University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/15/23/15_15.20180919/_pdf

Reference18 articles.

1. [1] “Intel and micron produce breakthrough memory technology,” http://newsroom.intel.com/community/intel_newsroom/blog/2015/07/28/inteland-micron-produce-breakthrough-memory-technology.

2. [2] “NVDIMM: Persistent memory performance,” https://enterprisestorage.micron.com/media/documents/products/productflyer/nvdimm_flyer.pdf.

3. [3] “Ultra-low latency with Samsung Z-NAND SSD,” https://www.samsung.com/us/labs/pdfs/collateral/Samsung_ZNAND_Technology_Brief_v5.pdf.

4. [4] J. Xu and S. Swanson: “NOVA: A log-structured file system for hybrid volatile/non-volatile main memories,” Proc. USENIX Conf. on File and Storage Technologies (2016) 323.

5. [5] S. Ghemawat and J. Dean: “LevelDB,” http://code.google.com/p/leveldb (2011).

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