A novel SEU tolerant memory cell for space applications
Author:
Affiliation:
1. Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
2. University of Chinese Academy of Sciences
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
https://www.jstage.jst.go.jp/article/elex/15/17/15_15.20180656/_pdf
Reference10 articles.
1. [1] E. Ibe, et al.: “Impact of scaling on neutron-induced soft error in SRAMs from a 250 nm to a 22 nm design rule,” IEEE Trans. Electron Devices 57 (2010) 1527 (DOI: 10.1109/TED.2010.2047907).
2. [2] P. E. Dodd and L. W. Massengill: “Basic mechanisms and modeling of single-event upset in digital microelectronics,” IEEE Trans. Nucl. Sci. 50 (2003) 583 (DOI: 10.1109/TNS.2003.813129).
3. [3] S. M. Jahinuzzaman, et al.: “A soft error tolerant 10T SRAMbit-cellwith differential read capability,” IEEE Trans. Nucl. Sci. 56 (2009) 3768 (DOI: 10.1109/TNS.2009.2032090).
4. [4] I.-S. Jung, et al.: “A novel sort error hardened 10T SRAM cells for low voltage operation,” MWSCAS (2012) 714 (DOI: 10.1109/MWSCAS.2012.6292120).
5. [5] S. Lin, et al.: “Analysis and design of nanoscale CMOS storage elements for single-event hardening with multiple-node upset,” IEEE Trans. Device Mater. Rel. 12 (2012) 68 (DOI: 10.1109/TDMR.2011.2167233).
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Design and Comparison of SEU Tolerant 10T Memory Cell for Radiation Environment Applications;EAI Endorsed Transactions on Energy Web;2024-02-01
2. A Highly Reliable and Radiation-Hardened Majority PFET-Based 10T SRAM Cell;Lecture Notes in Electrical Engineering;2021
3. Radiation Tolerant Memory Cell for Aerospace Applications;Lecture Notes in Electrical Engineering;2021
4. Radiation Immune SRAM Cell for Deep Space Applications;Lecture Notes in Electrical Engineering;2021
5. Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets;IEEE Access;2019
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3