Probe calibration by using a different type of probe as a reference in GTEM cell above 1GHz-Reference-Cited by-同舟云学术

Probe calibration by using a different type of probe as a reference in GTEM cell above 1GHz

Published:2010 Issue:6 Volume:7 Page:460-466
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Wu Ifong¹,Ishigami Shinobu¹,Gotoh Kaoru¹,Matsumoto Yasushi¹

Affiliation:

1. EMC Group, National Institute of Information and Communications Technology

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://www.jstage.jst.go.jp/article/elex/7/6/7_6_460/_pdf

Reference7 articles.

1. [1] S. Ishigami, H. Masuzawa, I. Nishiyama, T. Shinozuka, and Y. Yamanaka, “EM probe calibration by using open-ended waveguides, Part. 1,”IEICE Technical Report, EMCJ2002-50, pp. 49-54, 2002.

2. [2] S. Ishigami, H. Masuzawa, I. Nishiyama, T. Shinozuka, and Y. Yamanaka, “EM probe calibration by using open-ended waveguides, Part. 2,”Proc. IEICE Gen. Conf. '03, SB-2-7, 2003.

3. [3] IEEE Standards 1309: IEEE standard for calibration of electromagnetic field sensors and probes, excluding antennas, from 9kHz to 40GHz, 2005.

4. [4] S. Ishigami, M. Hanazawa, T. Shinozuka, and Y. Yamanaka, “Uncertainty of EM probe calibration by using TEM cell, ”Proc. IEICE-ESS Conf. IEICE '03, B-4-43, 2003.

5. [5] S. Ishigami and Y. Yamanaka, “Uncertainty of EM-probe calibration by using TEM cell (2), ”IEICE Technical Report, EMCJ2004-3, pp. 14-17, 2004.

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