Affiliation:
1. Department of Communication Engineering, National Defense Academy
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. [1] H. K. V. Lotsch, “Beam displacement at total reflection: The Goos-Hänchen effect I,” Optik, vol. 32, no. 2, pp. 116-137, April 1970.
2. [2] B. R. Horowitz and T. Tamir, “Unified theory of total reflection phenomena at a dielectric interface,” Appl. Phys., vol. 1, pp. 31-38, 1973.
3. Characteristics of a Gaussian beam at a dielectric interface
4. Nonspecular phenomena in beam fields reflected by multilayered media
5. Nonspecular phenomena on Gaussian beam reflection at dielectric interfaces
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