Affiliation:
1. Department of Communication Engineering National Defense Academy
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Reference30 articles.
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3. [3] H.K.V. Lotsch, “Beam displacement at total reflection: The Goos-Hänchen effect II,” Optik, vol.32, no.2, pp.189-204, April 1970.
4. [4] B.R. Horowitz and T. Tamir, “Lateral displacement of light beam at a dielectric interface,” J. Opt. Soc. Am., vol.61, no.5, pp.586-594, May 1971.
5. [5] B.R. Horowitz and T. Tamir, “Unified theory of total reflection phenomena at a dielectric interface,” Appl. Phys., vol.1, pp.31-38, 1973.
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