Time and frequency mixed-domain analysis of conducted emissions for types of diode
Author:
Affiliation:
1. Osaka University, Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
General Medicine
Link
https://www.jstage.jst.go.jp/article/comex/4/5/4_136/_pdf
Reference9 articles.
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2. [2] N. Oswald, P. Anthony, N. McNeill, and B. H. Stark, “An experimental investigation of the tradeoff between switching losses and EMI generation with hard-switched all-Si, Si-SiC, and all-SiC Device Combinations,” IEEE Trans. Power Electron., vol. 29, no. 5, pp. 2393–2407, May 2014. DOI:10.1109/TPEL.2013.2278919
3. [3] T. Ibuchi and T. Funaki, “Effect of diode operating temperature on conducted noise spectrum for CCM DC–DC boost converter,” IEICE Commun. Express, vol. 3, no. 9, pp. 269–274, Sept. 2014. DOI:10.1587/comex.3.269
4. [4] J. Lutz, A. Schlangenotto, U. Scheuermann, and R. Doncker, Semiconductor Power Devices — Physics, Characteristics, Reliability, Springer, 2011.
5. [5] G. Spiazzi, S. Buso, M. Citron, M. Corradin, and R. Pierobon, “Performance Evaluation of a Schottky SiC Power Diode in a Boost PFC Application,” IEEE Trans. Power Electron., vol. 18, no. 6, pp. 1249–1253, Nov. 2003. DOI:10.1109/TPEL.2003.818821
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