Affiliation:
1. Department of Physical Electronics, Tokyo Institute of Technology
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Reference40 articles.
1. [1] D. Petrovic, W. Rave, and G. Fettweis, “Performance degradation of coded-OFDM due to phase noise,” IEEE Semiannual Vehicular Technology Conference, vol.2, pp.1168-1172, April 2003. 10.1109/vetecs.2003.1207811
2. [2] T. Pollet, M. van Bladel, and M. Moeneclaey, “BER sensitivity of OFDM systems to carrier frequency offset and Wiener phase noise,” IEEE Trans. Commun,, vol.43, no.2/3/4, pp.191-193, Feb. 1995. 10.1109/26.380034
3. [3] A.G. Armada, “Understanding the effects of phase noise in orthogonal frequency division multiplexing (OFDM),” IEEE Trans. Broadcast., vol.47, no.2, pp.153-159, June 2001. 10.1109/11.948268
4. [4] L. Piazzo and P. Mandarini, “Analysis of phase noise effects in OFDM modems,” IEEE Trans. Commun., vol.50, no.10, pp.1696-1705, Oct. 2002. 10.1109/tcomm.2002.803989
5. [6] D.B. Leeson, “A simple model of feedback oscillator noise spectrum,” Proc. IEEE, vol.54, no.2, pp.329-330, Feb. 1966. 10.1109/proc.1966.4682
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献