Evaluation of Resistance and Inductance of Loose Connector Contact-Reference-Cited by-同舟云学术

Evaluation of Resistance and Inductance of Loose Connector Contact

Published:2013 Issue:9 Volume:E96.C Page:1148-1150
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

UEHARA Kazuya¹,HAYASHI Yu-ichi¹,MIZUKI Takaaki²,SONE Hideaki²

Affiliation:

1. Graduate School of Information Sciences, Tohoku University

2. Cyberscience Center, Tohoku University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/transele/E96.C/9/E96.C_1148/_pdf

Reference4 articles.

1. [1] Y. Hayashi and H. Sone, “Fundamental measurement of electromagnetic field radiated from a coaxial transmission line caused by connector contact failure,” IEICE Trans. Electron., vol.E91-C, no.8, pp.1306-1312, Aug. 2008.

2. [2] Y. Hayashi, S. Wu, J. Fan, T. Mizuki, and H. Sone, “Modeling connector contact condition using a contact failure model with equivalent inductance,” IEEE International Symposium on Electromagnetic Compatibility (EMC 2010), pp.743-747, July 2010. DOI: 10.1109/ISEMC.2010.5711371

3. [3] K. Matsuda, Y. Hayashi, T. Mizuki, and H. Sone, “Relation between extended current path and increase in inductance at connector contact boundary,” 2012 IEICE Gen. Conf., C-5-1, March 2012 (in Japanese).

4. [4] K. Matsuda, Y. Hayashi, T. Mizuki, and H. Sone, “Investigation of mechanism of increase in inductance at loosened connector contact boundary,” IEICE Trans. Electron., vol.E95-C, no.9, pp.1502-1507, Sept. 2012.

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