Affiliation:
1. Nara Institute of Science and Technology
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. [1] Y. Hayashi, T. Mizuki, and H. Sone, “Analysis of electromagnetic radiation from transmission line with loose contact of connector,” IEICE Trans. Electron., vol.E94-C, no.9, pp.1427-1430, Sept. 2011. 10.1587/transele.e94.c.1427
2. [2] K. Matsuda, Y. Hayashi, T. Mizuki, and H. Sone, “Fundamental study on mechanism of electromagnetic field radiation from electric devices with loose contact of connector,” IEEJ Trans. Fundamentals and Materials, vol.132, no.5, pp.373-378, 2012 (in Japanese). 10.1541/ieejfms.132.373
3. [3] K. Matsuda, Y. Hayashi, T. Mizuki, and H. Sone, “Effect of inductance at connector contact boundary on common-mode current from interconnected devices,” IEICE Technical Report, EMD1022-95, pp.151-154, 2011.
4. [4] Keysight, “Time domain reflectometry theory,” Application Note, 5966-4855E, 2015.
5. [5] K. Uehara, Y. Hayashi, T. Mizuki, and H. Sone, “Evaluation of resistance and inductance of loose connector contact,” IEICE Trans. Electron., vol.E96-C, no.9, pp.1148-1150, Sept, 2013. 10.1587/transele.e96.c.1148
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Extraction of Audio Information from EM Emission Caused by Loose Connectors;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20
2. Investigation on vibration induced fretting in degraded contact interface;Microelectronics Reliability;2022-12