Affiliation:
1. Graduate School of Science and Engineering, Saitama Univeristy
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. [1] R. Baumann, “Soft errors in advanced computer systems,” IEEE Design & Test of Computers, vol.22, no.3, pp.258-266, 2005. 10.1109/mdt.2005.69
2. [2] F. Wang and V.D. Agrawal, “Single event upset: An embedded tutorial,” Proc. Int. Conf. VLSI Design, pp.429-434, 2008. 10.1109/vlsi.2008.28
3. [3] F.L. Kastensmidt, L. Sterpone, L. Carro, and M.S. Reorda, “On the optimal design of triple modular redundancy logic for SRAM-based FPGAs,” Proc. DATE 2005, pp.1290-1295, 2005. 10.1109/date.2005.229
4. [4] S. Golshan and E. Bozorgzadeh, “SEU-aware resource binding for modular redundancy based designs on FPGAs,” Proc. DATE 2009, pp.1124-1129, 2009. 10.1109/date.2009.5090832
5. [5] T. Imagawa, H. Tsutsui, H. Ochi, and T. Sato, “A cost-effective selective TMR for coarse-grained reconfigurable architectures based on dfg-level vulnerability analysis,” IEICE Trans. Electron., vol.E96-C, no.4, pp.454-462, 2013. 10.1587/transele.e96.c.454
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