Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design
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Published:2015
Issue:1
Volume:E98.C
Page:35-44
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ISSN:0916-8524
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Container-title:IEICE Transactions on Electronics
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language:en
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Short-container-title:IEICE Trans. Electron.
Author:
Kaan TOKGOZ Korkut1, LIM Kimsrun1, KAWAI Seitarou1, FAJRI Nurul1, OKADA Kenichi1, MATSUZAWA Akira1
Affiliation:
1. Tokyo Institute of Technology
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. [1] K. Okada, K. Kondou, M. Miyahara, M. Shinagawa, H. Asada, R. Minami, T. Yamaguchi, A. Musa, Y. Tsukui, Y. Asakura, S. Tamonoki, H. Yamagishi, Y. Hino, T. Sato, H. Sakaguchi, N. Shima -saki, T. Ito, Y. Takeuchi, N. Li, Q. Bu, R. Murakami, K. Bunsen, K. Matsushita, M. Noda, and A. Matsuzawa, “Full four-channel 6.3-Gb/s 60-GHz CMOS transceiver with low-power analog and digital baseband circuitry,” IEEE J. Solid-State Circuits, vol.48, no.1, pp.46–65, Jan. 2013. 2. [2] Q.-H. Bu, N. Li, K. Okada, and A. Matsuzawa, “Evaluation of L-2L de-embedding method considering misalignment of contact position for millimeter-wave CMOS circuit design,” IEICE Trans. Electron., vol.E95-C, no.5, pp.942–948, May 2012. 3. [3] N. Li, K. Matsushita, N. Takayama, S. Ito, K. Okada, and A. Matsu -zawa, “Evaluation of a multi-line de-embedding technique up to 110 GHz for millimeter-wave CMOS circuit design,” IEICE Trans. Fundamentals, vol.E93-A, no.2, pp.431–439, Feb. 2010. 4. [4] R. Minami, C. Han, K. Matsushita, K. Okada, and A. Matsuzawa, “Effect of transmission line modeling using different de-embedding methods,” EuMC, pp.381–384, Oct. 2011. 5. [5] V. Issakov, M. Wojnowski, A. Thiede, and R. Weigel, “Considerations on the de-embedding of differential devices using two-port techniques,” EuMC, pp.695–698, Oct. 2009.
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