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Two-Tone Signal Generation for ADC Testing

Published:2013 Issue:6 Volume:E96.C Page:850-858
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

KATO Keisuke¹,ABE Fumitaka¹,WAKABAYASHI Kazuyuki¹,GAO Chuan¹,YAMADA Takafumi¹,KOBAYASHI Haruo¹,KOBAYASHI Osamu²,NIITSU Kiichi³

Affiliation:

1. Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University

2. Semiconductor Technology Academic Research Center (STARC)

3. Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/transele/E96.C/6/E96.C_850/_pdf

Reference16 articles.

1. [1] Y. Motoki, H. Sugawara, H. Kobayashi, T. Komuro, and H. Sakayori, “Multi-tone curve fitting algorithms for communication application ADC testing,” Electronics and Communication in Japan: Part 2, vol.86, no.8, pp.1-11, 2003.

2. [2] M. Gustavsson, J.J. Wikner, and N.N. Tan, CMOS Data Converters for Communications, Kluwer Academic Publisher, 2000.

3. [3] B. Razavi, RF Microelectronics, Prentice Hall, 1998.

4. [4] K. Wakabayashi, T. Yamada, S. Uemori, O. Kobayashi, K. Kato, H. Kobayashi, K. Niitsu, H. Miyashita, S. Kishigami, K. Rikino, Y. Yano, and T. Gake, “Low-distortion single-tone and two-tone sinewave generation algorithms using an arbitrary waveform generator,” IEEE International Mixed-Signals, Sensors and Systems Test Workshop, Santa Barbara, CA, May 2011.

5. [5] K. Wakabayashi, K. Kato, T. Yamada, O. Kobayashi, H. Kobayashi, F. Abe, and K. Niitsu, “Low-distortion sinewave generation method using arbitrary waveform generator,” J. Electronic Testing: Theory and Applications, Special Issue on Analog, Mixed-Signal, RF and MEMS Testing, vol.28, no.5, pp.641-651, Oct. 2012.

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