Phase difference analysis technique for parametric faults BIST in CMOS analog circuits
Author:
Affiliation:
1. VLSI Design and Automotion Research Laboratory, Kochi University of Technology
2. Center of Excellence in Intelligent System Integration, Thai-Nichi Institute of Technology
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
https://www.jstage.jst.go.jp/article/elex/15/9/15_15.20180175/_pdf
Reference14 articles.
1. [1] J. W. Jeong, et al.: “Robust amplitude measurement for RF BIST applications,” IEEE European Test Symposium (ETS) (2015) 1 (DOI: 10.1109/ETS.2015.7138762).
2. [2] W. San-Um and T. Masayoshi: “Impulse signal generation and measurement technique for cost-effective built-in self test in analog mixed-signal systems,” IEEE Int. Midwest Symp. Circuits and Systems (2009) 1195 (DOI: 10.1109/MWSCAS.2009.5235949).
3. [3] G. Hu, et al.: “Oscillation test strategy for analog filters by monitoring output voltage and supply current,” Tsinghua Sci. Technol. 12 (2007) 78 (DOI: 10.1016/S1007-0214(07)70088-3).
4. [4] K. Kim, et al.: “A low-cost BIST based on histogram testing for analog to digital converters,” IEICE Trans. Electron. E91-C (2008) 670 (DOI: 10.1093/ietele/e91-c.4.670).
5. [5] G. Renaud, et al.: “Design of an on-chip stepwise ramp generator for ADC static BIST applications,” IEEE Int. Mixed-Signals Testing Workshop (IMSTW) (2015) 1 (DOI: 10.1109/IMS3TW.2015.7177876).
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Operational Amplifiers Defect Detection and Localization Using Digital Injectors and Observer Circuits;Electronics;2024-07-21
2. A defects classification algorithm for the hybrid OBT-IDDQ fault diagnosis technique in analog CMOS integrated circuits;Journal of Circuits, Systems and Computers;2023-11-17
3. Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22
4. Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits;2023-05-11
5. All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3