A Process and Temperature Tolerant Oscillator-Based True Random Number Generator-Reference-Cited by-同舟云学术

A Process and Temperature Tolerant Oscillator-Based True Random Number Generator

Published:2014 Issue:12 Volume:E97.A Page:2393-2399
ISSN:0916-8508
Container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
language:en
Short-container-title:IEICE Trans. Fundamentals

Author:

AMAKI Takehiko¹²,HASHIMOTO Masanori¹²,ONOYE Takao¹²

Affiliation:

1. Department of Information Systems Engineering, Osaka University

2. JST, CREST

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing

Link

https://www.jstage.jst.go.jp/article/transfun/E97.A/12/E97.A_2393/_pdf

Reference13 articles.

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2. [2] S. Srinivasan, S. Mathew, R. Ramanarayanan, F. Sheikh, M. Anders, H. Kaul, V. Erraguntla, R. Krishnamurthy, and G. Taylor, “2.4GHz 7mW all-digital PVT-variation tolerant true random number generator in 45nm CMOS,” Symposium on VLSI Circuits, pp.203-204, 2010.

3. [3] M. Bucci and R. Luzzi, “Fully digital random bit generators for cryptographic applications,” IEEE Trans. Circuits Syst. I, vol.55, no.3, pp.861-875, 2008.

4. [4] G.K. Balachandran and R.E. Barnett, “A 440-nA true random number generator for passive RFID tags,” IEEE Trans. Circuits Syst. I, vol.55, no.11, pp.3723-3732, 2008.

5. [5] B. Sunar, B. Sunar, W.J. Martin, and D.R. Stinson, “A provably secure true random number generator with built-in tolerance to active attacks,” IEEE Trans. Comput., vol.56, no.1, pp.109-119, 2007.

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