An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM
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Published:2021-11-01
Issue:11
Volume:E104.A
Page:1536-1545
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ISSN:0916-8508
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Container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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language:en
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Short-container-title:IEICE Trans. Fundamentals
Author:
IGARASHI Mitsuhiko1, UCHIDA Yuuki1, TAKAZAWA Yoshio1, YABUUCHI Makoto1, TSUKAMOTO Yasumasa1, SHIBUTANI Koji1, KOBAYASHI Kazutoshi2
Affiliation:
1. Renesas Electronics Corporation 2. Kyoto Institute of Technology
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing
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