Present status and future prospects of electric force microscopy-Reference-Cited by-同舟云学术

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Present status and future prospects of electric force microscopy

Published:2017 Issue:2 Volume:8 Page:80-84
ISSN:2185-4106
Container-title:Nonlinear Theory and Its Applications, IEICE
language:en
Short-container-title:NOLTA

Author:

Yamada Hirofumi¹

Affiliation:

1. Graduate School of Engineering, Kyoto University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Rehabilitation,Physical Therapy, Sports Therapy and Rehabilitation,General Medicine

Link

https://www.jstage.jst.go.jp/article/nolta/8/2/8_80/_pdf

Reference17 articles.

1. [1] T.R. Albrecht, P. Grutter, D. Horne, and D. Rugar, “Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity,” J. Appl. Phys., vol. 69, pp. 668-673, January 1991.

2. [2] S. Morita, R. Wiesendanger, and E. Meyer (eds.), “Noncontact Atomic Force Microscopy,” Springer, Berlin, September 2002.

3. [3] S. Morita, F.J. Giessibl, and R. Wiesendanger (eds.), “Noncontact Atomic Force Microscopy: Volume 2,” Springer, Berlin, October 2009.

4. [4] S. Kitamura and M. Iwatsuki, “High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope,” Appl. Phys. Lett., vol. 72, pp. 3154-3156, June 1998.

5. [5] L. Gross, F. Mohn, N. Moll, P. Liljeroth, and G. Meyer, “The chemical structure of a molecule resolved by atomic force microscopy,” Science, vol. 325, pp. 1110-1114, August 2009.

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