High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.121577
Reference8 articles.
1. High resolution atomic force microscopy potentiometry
2. Kelvin probe force microscopy
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4. Imaging integrated circuit dopant profiles with the force-based scanning Kelvin probe microscope
5. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
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