Application of Support Vector Regression for Simultaneous Modelling of near Infrared Spectra from Multiple Process Steps

Abstract

Near infrared (NIR) spectroscopy in combination with partial least-squares regression (PLS) is widely applied in process control for non-destructive measurement of quality parameters during production. PLS assumes an approximate linear relationship between the parameter to be estimated and the intensity of its absorption bands. Spectra, however, may contain non-linearities for various reasons such as differences in viscosity, temperature, pH, particle size and chemical composition of the sample matrix. In such cases, PLS might not predict the parameter of interest sufficiently well, and one must find other methods for the calibration task. Support vector machine regression (SVR) has been gaining interest within chemometrics in recent years. SVR is capable of modelling highly non-linear data, also when data are of very high dimensions. The aim of this study was to develop calibration models of NIR spectra from four different process steps in a raw-sugar factory. The models were intended for monitoring two quality parameters at the individual process steps. Our goal was to obtain global calibration models covering all four process steps in order to obtain simple calibration maintenance. SVR was used for the calibration task, since all of the above-mentioned sources of non-linearities were present. SVR results were benchmarked against PLS. SVR had a better prediction performance than PLS (1) for models built on individual process steps, (2) for global models covering all four process steps and (3) when the global models were evaluated on the individual process steps. Moreover, the majority of SVR models had prediction errors close to reference uncertainty and hence were close to being optimal. Finally, the global SVR models predicted the individual process steps better than the corresponding local PLS models. We conclude that the nonlinear modelling method SVR was able to model non-linearities caused by pooling NIR spectra from multiple different process steps. Implementation of the global SVR models would have several advantages over the local PLS models. First, they would allow simple calibration maintenance because only one model per quality parameter would have to be maintained. Second, they would allow more precise estimation of the quality parameters and therefore better process monitoring.