Thickness dependences of optical constants for thin layers of some metals and semiconductors-Reference-Cited by-同舟云学术

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Thickness dependences of optical constants for thin layers of some metals and semiconductors

Published:2001-12-12 Issue:4 Volume:4 Page:353-357
ISSN:1560-8034
Container-title:Semiconductor Physics, Quantum Electronics and Optoelectronics
language:
Short-container-title:Semicond. Phys. Quantum Electron. Optoelectron.

Author:

Kovalenko S.A.,

Publisher

National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. 1. B. Poqany // Ann. d. Phys. 49, p. 537 (1916).

2. 2. I. Kraumkramer // Proc. Phys. Soc. 32, p. 537 (1938).

3. 3. G. V. Rozenberg. Optics of thinlayer coatings, Gosenergoizdat.fiz.-mat. lit., ?oscow. 1958.

4. 4. S. Methfessel. Dunne Schichten (Ihre Herstellung und Messung), p.68, Veb Wilhelm Knapp Verlag, Halle (Saale) (1953).

5. 5. M. P. Lisitsa, N. G. Tsvelykh, Optics of thin film (II Te) // Optika i spektroskopiya, 4(3), pp.373-377 (1958) (in Russian).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomic Layer Deposition;Handbook of Thin Film Deposition;2018

2. Probing initial-stages of ALD growth with dynamic in situ spectroscopic ellipsometry;Applied Surface Science;2015-02

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