Publisher
National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. 1. Lebedev A.I. Physics of Semiconductor Devices. Moscow: Fizmatlit, 2008 (in Russian).
2. 2. Bazu M., Bajenescu T. Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems. Vol. 4. John Wiley & Sons, 2011.
3. 3. Belyaev A.E., Boltovets N.S., Venger E.F. et al. Physico-technological Aspects of Degradation of Silicon Microwave Diodes. Kyiv: Akadem-periodyka, 2011.
4. 4. Romanets P.M., Belyaev A.E., Sachenko А.V., Boltovets N.S., Basanets V.V., Konakova R.V., Slipokurov V.S., Khodin А.А., Pilipenko V.А., Shynkarenko V.V., Kudryk Ya.Ya. Theoretical and experimental modelling the specific resistance of vertical ohmic contacts Au-Ti-Pd-n+-n-n+-Si in IMPATT diodes. Semiconductor Physics, Quantum Electronics & Optoelectronics. 2016. 19, No 4. P. 366-370.
5. 5. Gantmakher V.F., Levinson I.B. Carrier Scattering in Metals and Semiconductors. Elsevier Science Pub. Co., 1987.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献