Author:
Okhrimenko O.B., ,Bacherikov Yu.Yu.,Kolomys O.F.,Strelchuk V.V.,Konakova R.V., , , ,
Abstract
In this work, the authors have considered the effect of short-term nonthermal action of microwave radiation on the photoluminescent characteristics of SiC/por-SiC/Er2O3 and SiC/por-SiC structures. The analysis of photoluminescence spectra of these structures, which are excited by radiation with an energy lower than the band gap in the 4H-SiC crystalline substrate, has shown that short-term action of microwave radiation leads to redistribution of radiative recombination centers, which is caused by surface states in the por-SiC layer.
Publisher
National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka) (Publications)
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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1. Metal oxides for electronics and the SPQEO journal;Semiconductor Physics, Quantum Electronics and Optoelectronics;2024-06-21