Impact of circuit metallization on dielectric permittivity measurement by scanning microwave microscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
https://iopscience.iop.org/article/10.35848/1347-4065/aba73a/pdf
Reference39 articles.
1. Quasi-TEM description of MMIC coplanar lines including conductor-loss effects
2. Full-wave analysis of conductor losses on MMIC transmission lines
3. Modeling dispersion and radiation characteristics of conductor-backed CPW with finite ground width
4. Crosstalk Corrections for Coplanar-Waveguide Scattering-Parameter Calibrations
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2. Accuracy improvement in estimation of electrical properties of millimeter-wave circuit by probe-backside reflection method;Japanese Journal of Applied Physics;2022-08-23
3. Evaluation of the temperature dependence of dielectric properties using probe-backside reflection method at millimeter-wave frequencies;Japanese Journal of Applied Physics;2021-07-12
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