Evaluation of the temperature dependence of dielectric properties using probe-backside reflection method at millimeter-wave frequencies
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
https://iopscience.iop.org/article/10.35848/1347-4065/ac0f0d/pdf
Reference38 articles.
1. An introduction to millimeter-wave mobile broadband systems
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3. 6G: The Next Frontier: From Holographic Messaging to Artificial Intelligence Using Subterahertz and Visible Light Communication
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1. Study on measurement capability of probe-backside reflection method for evaluation of dielectric materials;Japanese Journal of Applied Physics;2023-07-25
2. Accuracy improvement in estimation of electrical properties of millimeter-wave circuit by probe-backside reflection method;Japanese Journal of Applied Physics;2022-08-23
3. Materials informatics for dielectric loss tangent in the millimeter wave region;Japanese Journal of Applied Physics;2022-07-22
4. Improvement in measurement accuracy of on-wafer measurements from millimeter-wave to Terahertz frequencies;2021 IEEE CPMT Symposium Japan (ICSJ);2021-11-10
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