Photo-Excited DLTS: Measurement of Minority Carrier Traps
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Correlating the perovskite/polymer multi-mode reactions with deep-level traps in perovskite solar cells;Joule;2022-12
2. Study of InAlGaN/GaN HEMT structures by DLTFS with optical excitation;2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM);2022-10-23
3. Revealing composition and structure dependent deep-level defect in antimony trisulfide photovoltaics;Nature Communications;2021-05-31
4. Probing the trap states in N–i–P Sb2(S,Se)3 solar cells by deep-level transient spectroscopy;The Journal of Chemical Physics;2020-09-28
5. Reliability improvement of electrically active defect investigations by analytical and experimental deep level transient: Fourier spectroscopy investigations;Journal of Electrical Engineering;2019-09-28
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