Effect of $\bf H_{2}$ Annealing on a $\bf Pt/PbZr_{\ninmbi x}Ti_{1-{\ninmbi x}}O_{3}$ Interface Studied by X-Ray Photoelectron Spectroscopy-Reference-Cited by-同舟云学术

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Effect of $\bf H_{2}$ Annealing on a $\bf Pt/PbZr_{\ninmbi x}Ti_{1-{\ninmbi x}}O_{3}$ Interface Studied by X-Ray Photoelectron Spectroscopy

Published:1997-04-01 Issue:Part 2, No. 4A Volume:36 Page:L435-L438
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Takatani Shinichiro,Kushida-Abdelghafar Keiko,Miki Hiroshi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 36 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. The influence of Mn doping on the leakage current mechanisms and resistance degradation behavior in lead zirconate titanate films;Acta Materialia;2021-04

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