In Situ Photoluminescence Analysis of Nonradiative Recombination on Silicon Surfaces Treated in Fluoride Solution-Reference-Cited by-同舟云学术

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In Situ Photoluminescence Analysis of Nonradiative Recombination on Silicon Surfaces Treated in Fluoride Solution

Published:1997-01-15 Issue:Part 2, No. 1A/B Volume:36 Page:L58-L60
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Timoshenko Victor Yurievich,Rappich Jörg,Dittrich Thomas

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. Passivation of textured substrates for a-Si:H/c-Si hetero-junction solar cells: Effect of wet-chemical smoothing and intrinsic a-Si:H interlayer;Materials Science and Engineering: B;2009-03

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