Measurement of Young's Modulus in Amorphous Silicon Whiskers
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/17/i=8/a=1465/pdf
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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2. Tailoring the spring constant of Si nanorod structures using swift heavy ion irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-12
3. Mechanical Testing of Isolated Amorphous Silicon Slanted Nanorods;Journal of Nanoscience and Nanotechnology;2005-11-01
4. The model of solid phase crystallization of amorphous silicon under elastic stress;Journal of Applied Physics;2000-04-15
5. Effects of elastic stress introduced by a silicon nitride cap on solid-phase crystallization of amorphous silicon;Journal of Applied Physics;1999-08-15
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