Ge K-Edge Extended X-Ray Absorption Fine Structure Study of the Local Structure of Amorphous GeTe and the Crystallization-Reference-Cited by-同舟云学术

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Ge K-Edge Extended X-Ray Absorption Fine Structure Study of the Local Structure of Amorphous GeTe and the Crystallization

Published:1991-01-15 Issue:Part 1, No. 1 Volume:30 Page:101-106
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Maeda Yoshihito,Wakagi Masatoshi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 52 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study of the amorphous and crystalline states in Ge(Te1-xSex) thick films (x = 0, 0.50) by in situ temperature-dependent structural analyses;Journal of Alloys and Compounds Communications;2024-07

2. Atomistic Study of the Configurational Entropy and the Fragility of Supercooled Liquid GeTe;Advanced Functional Materials;2024-02-06

3. Local structure effects of carbon-doping on the phase change material Ge₂Sb₂Te₅;Journal of Materials Chemistry C;2024

4. Evolution of Short‐Range Order of Amorphous GeTe Upon Structural Relaxation Obtained by TEM Diffractometry and RMC Methods;Advanced Science;2023-10-31

5. Structural properties of Ga18Ge20.9Te61.2 alloys;Physics and Chemistry of Solid State;2022-12-26

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