Influence of the Amorphous Silicon Thickness on Top Gate Thin-Film Transistor Electrical Performances-Reference-Cited by-同舟云学术

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Influence of the Amorphous Silicon Thickness on Top Gate Thin-Film Transistor Electrical Performances

Published:2001-02-15 Issue:Part 1, No. 2A Volume:40 Page:530-537
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Martin Sandrine,Chiang Chun-Sung,Nahm Jeong-Yeop,Li Tong,Kanicki Jerzy,Ugai Yasuhiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

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