10 keV X-Ray Phase-Contrast Microscopy for Observing Transparent Specimens-Reference-Cited by-同舟云学术

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10 keV X-Ray Phase-Contrast Microscopy for Observing Transparent Specimens

Published:2001-11-01 Issue:Part 2, No. 11A Volume:40 Page:L1190-L1192
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kagoshima Yasushi,Ibuki Takashi,Yokoyama Yoshiyuki,Tsusaka Yoshiyuki,Matsui Junji,Takai Kengo,Aino Masataka

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

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