Suppression of Leakage Current in Solid-Phase Crystallization Silicon Thin-Film Transistors Employing Off-State-Bias Annealing
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Reference11 articles.
1. Charge trapping instabilities in amorphous silicon‐silicon nitride thin‐film transistors
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4. 4.2: TFT AMOLED Pixel Circuits and Driving Methods
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